1

Electrical behaviour of aluminium-porous silicon junctions

Year:
1995
Language:
english
File:
PDF, 370 KB
english, 1995
2

Dynamic behavior of amplitude detection Kelvin force microscopy in ultrahigh vacuum

Year:
2010
Language:
english
File:
PDF, 476 KB
english, 2010
4

Identification of a defect in a semiconductor: EL2 in GaAs

Year:
1986
Language:
english
File:
PDF, 1.39 MB
english, 1986
35

Localization and delocalization of charges injected in DNA

Year:
2004
Language:
english
File:
PDF, 517 KB
english, 2004
46

A simple measure of defect concentration in heavily compensated semiconductor

Year:
1989
Language:
english
File:
PDF, 512 KB
english, 1989
49

surfaces

Year:
2005
Language:
english
File:
PDF, 600 KB
english, 2005